OPTICAL METROLOGY
At Demcon Focal we have developed a update of the Nanomefos, a turnkey measurement system for surface measurement of aspherical and freeform optics. We also have expertise in the field of surface measurement and analysis and low coherence interferometry.

For more information about our solutions, please contact Gerard van den Eijkel via gerard.van.den.eijkel@demcon.com or download brochure Optical metrology.