About the project

Classification of wafer inspection results requires proper image analysis methods. Demcon Focal is specialized in designing the proper inspection hardware and also designing data analysis software, including deep learning and neural network combinations for recognition and classification purposes.

We are specialized in pre-trained deep learning network for automated feature extractions including a two-step network layer which the customer can create and train themselves, without having knowledge of deep learning or neural networks. We also offer the generation of synthetic data that can be used to train the neural network. This will reduce the NRE inspection-module cost drastically when introducing new designs.

Do you have a question about this use case? Feel free to contact us.

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