Wafer inspection and chip inspection require proper imaging hardware and analysis methods. Demcon Focal is specialized in designing the proper inspection hardware and also designing data analysis software, including deep learning and neural network combinations for recognition purposes.

We have developed our own software platform called IVISYS. This is a generic software platform that can handle most of the camera systems and which can be connected to a variety of PLC systems. The platform also features imaging, data and event logging in various formats. Overall this platform reduces the software development time drastically.